- A double lamellae dropoff etching procedure for tungsten tips attached to tunning fork atomic force microscopy/scanning tunneling microscopy sensors
Description
- Title: A double lamellae dropoff etching procedure for tungsten tips attached to tunning fork atomic force microscopy/scanning tunneling microscopy sensors
- Journal title: Review of Scientific Instruments
- Creator: Kulawik, M ; Nowicki, Marek
- Pages: s. 1027-1030
- Description: Ref. ; Abstr.
- Language of abstract: eng
- Date issued: 2003
- Type: Tekst
- Language: eng
- Detailed object type: art
- Object type: Artykuł
- Location: Vol. 74, iss. 2 (2003)