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  • An investigation of thin Zr films on 6H-SiC(0001) and GaN(0001) surfaces by XPS, LEED, and STM

Description

  • Title: An investigation of thin Zr films on 6H-SiC(0001) and GaN(0001) surfaces by XPS, LEED, and STM
  • Journal title: Applied Physics. A
  • Creator: Idczak, Karolina ; Mazur, Piotr ; Zuber, Stefan ; Markowski, Leszek
  • Pages: s. 1-10
  • Description: Zawiera wykresy. ; Zawiera ilustracje. ; Zawiera fotografie. ; Bibliogr. ; Streszcz. w jęz. ang.
  • Language of abstract: eng
  • Date issued: 2016
  • Type: Tekst
  • Identifier: ISSN 0947-8396
  • Language: eng
  • Has version: http://dx.doi.org/10.1007/s00339-016-9801-8
  • Detailed object type: art
  • Object type: Artykuł
  • Location: Vol. 122, iss. 4 (2016), nr art. 268, s. 1-10 : il., fot.

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Program Operacyjny Polska Cyfrowa
Rzeczpospolita Polska
Europejski Fundusz Rozwoju Regionalnego Unii Europejskiej
Biblioteka Uniwersytecka we Wrocławiu
Uniwersytet Wrocławski

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