- Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications
Description
- Title: Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications
- Journal title: Review of Scientific Instruments
- Creator: Morawski, Ireneusz ; Spiegelberg, Richard ; Korte, Stefan ; Voigtlaender, Bert
- Pages: s. 123703-1-123703-17
- Description: Zawiera wykresy. ; Zawiera ilustracje. ; Zawiera fotografie. ; Bibliogr. ; Przy nazwisku Ireneusz Morawski podwójna afiliacja: Peter Grünberg Institut (PGI-3) and JARA - Fundamentals of Future Information Technology, Forschungzentrum Jülich, Germany i Institute of Experimental Physics, University of Wrocław. ; Streszcz. w jęz. ang.
- Language of abstract: eng
- Date issued: 2015
- Type: Tekst
- Identifier: ISSN 0034-6748
- Language: eng
- Has version: http://dx.doi.org/10.1063/1.4936975
- Detailed object type: art
- Object type: Artykuł
- Location: Vol. 86, iss. 12 (2015), s. 123703-1-123703-17 : il., fot.