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  • Structural investigations of TiO2:Tb thin films by X-ray diffraction and atomic force microscopy

Description

  • Title: Structural investigations of TiO2:Tb thin films by X-ray diffraction and atomic force microscopy
  • Journal title: Applied Surface Science
  • Creator: Kaczmarek, Danuta ; Domaradzki, Jarosław ; Wojcieszak, Damian ; Wasielewski, Radosław ; Prociow, E.L ; Ciszewski, Antoni
  • Pages: s. 4303-4307
  • Description: Zawiera wykresy. ; Zawiera tabele. ; Zawiera fotografie. ; Ref. ; Proceedings of the 3rd International Workshop on Surface Physics "Nanostructures on Surface" - IWSP-2007, Polanica Zdrój, Poland, 10-15 September 2007. ; Abstr.
  • Language of abstract: eng
  • Date issued: 2008
  • Type: Tekst
  • Language: eng
  • Detailed object type: art
  • Object type: Artykuł
  • Location: Vol. 254, iss. 14 (2008), s. 4303-4307 : fot., wykr.

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Rzeczpospolita Polska
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Biblioteka Uniwersytecka we Wrocławiu
Uniwersytet Wrocławski

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