Scanning Tunnelling Microscopy/Spectroscopy and Low-Energy Electron Diffraction Investigations of GaTe Layered Crystal Cleavage Surface

Galiy, P; Nenchuk, T; Ciszewski, Antoni; Mazur, Piotr; Zuber, Stefan; Yarovets, I

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Scanning Tunnelling Microscopy/Spectroscopy and Low-Energy Electron Diffraction Investigations of GaTe Layered Crystal Cleavage Surface

Description

Title: Scanning Tunnelling Microscopy/Spectroscopy and Low-Energy Electron Diffraction Investigations of GaTe Layered Crystal Cleavage Surface
Journal title: Metallofizika i Noveishie Tekhnologii
Creator: Galiy, P ; Nenchuk, T ; Ciszewski, Antoni ; Mazur, Piotr ; Zuber, Stefan ; Yarovets, I
Pages: s. 789-801
Description: Zawiera wykresy. ; Zawiera ilustracje. ; Zawiera fotografie. ; Bibliogr. ; Streszcz. w jęz. ang., ukr.
Language of abstract: eng ; ukr
Date issued: 2015
Type: Tekst
Identifier: ISSN 1024-1809
Language: eng
Detailed object type: art
Object type: Artykuł
Location: Vol. 37, iss. 6 (2015), s. 789-801 : il., fot.

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